Research
Title : | Reliability of SiGe channel pMOSFET's |
Area of Research : | Engineering Sciences |
Focus Area : | SiGe channel |
Principal Investigator : | Dr. Deleep R. Nair, Associate Professor, Department of Electrical Engineering, Indian Institute of Technology (IIT), Chennai, Tamil Nadu |
Contact info : | deleep@iitm.ac.in |
Timeline Start Year : | 2016 |
Total Budget (INR): | 68,89,080 |