Executive Summary : | X-rays have numerous applications in medical diagnostic imaging, industrial non-destructive testing, and homeland security. Low dose X-ray radiation devices are crucial for medical diagnostic, therapy, and monitoring to reduce health hazards caused by high dose accumulation. Detection of X-rays can be direct or indirect. Direct conversion X-ray sensors are fabricated using various materials, such as nanocrystalline Zn(Cu)O, BiOI, Cu2HgI4, Y2O3, CsPbI3, BiI3, Cs3Bi2I9, BiPO4, and PbWO4. Indirect conversion X-ray sensors are proposed for low-dose (mGy) X-ray in the intra-oral energy region. Scintillators exhibit high X-ray stopping power, light yield, fast response, decay time, chemical stability, radiation resistance, and linearity of light response with respect to different X-ray doses. These indirect sensors can provide superior sensitivity than direct conversion sensors due to their unique properties, such as separating signal response from X-rays based on pulsed shape discrimination. The quantum efficiency, spectral response, and full potential of electronic charge carrier generation depend on the good match of photodiodes with respect to the scintillator. This technique offers low manufacturing costs and high efficiency, achieving a minimum area of sample coated in the device. Experiments will be conducted to investigate the low-dose sensing behavior of nanocrystalline CsPbBr3, Cs3Cu2I5, and Cs2AgBiBr6 at various doses produced using a calibrated intraoral pulsed X-ray machine. The study will also investigate the effect of doping, grain-size, and coating thicknesses on the superior sensing nature of X-ray sensors. |