Research

Astronomy & Space Sciences

Title :

Development of Methods in design-for-test (DFT), built-in self-test (BIST) for mixed-signal VLSI circuits and systems for mission critical applications

Area of research :

Astronomy & Space Sciences, Engineering Sciences

Focus area :

Development of DFT and BIST

Principal Investigator :

Prof. Siddhartha Mukhopadhyay, Department of Electrical Engineering, Indian Institute of Technology (IIT), Kharagpur

Contact info :

Details

Organizations involved