Technologies
Title: | FlawGuard: A Cost Effective Device for defect Detection in Wire during Cold Drawing |
Area: | Chemical Sciences, Material Sciences |
Sub Area: | Chemical technology |
Focus Area: | Metallurgy |
Developing Agency: | CSIR-National Metallurgical Laboratory (NML), Jamshedpur |
Technology Readiness Index: | Prototype |
Email: | director@nmlindia.org |
| Website Link : | https://www.nmlindia.org/ |
Brief Description
Description : | Test material diameter: 1.5 mm - 2.5 mm. Operating frequency: 10 Khz. Depth Resolution: 200 p. Drawing line speed: up to 12 m/s. LCD display. Software for data logging to identify defect location. Interfacing through LAN. Analog output for further signal analysis. Alarm: LED & Buzzer. Standalone as well as laptop based. Power Requirement: 220V/50Hz, Weight: 1.5 Kg; Dimension: 300 x 300 x 100 (all in mm). |